Micro-Fabric Analyzer (MFA): A New Semiautomated ArcGIS-Based Edge Detector for Quantitative Microstructural Analysis of Rock Thin-Sections

Micro-Fabric Analyzer (MFA) is a new GIS-based tool for the quantitative extrapolation of rock microstructural features that takes advantage both characteristics X-ray images and optical image features. Most previously developed edge mineral grain detectors are uniquely based on physical properties X-ray-, electron-, or optical-derived images; not permitting exploitation specific each type at same time. More advanced techniques, such as 3D microtomography, permit reconstruction tridimensional models fabric arrays, even though adjacent boundaries with atomic density often detectable. Only electron backscatter diffraction (EBSD) allows providing high-performing boundary detection crystallographically differentiated per phase, it relatively expensive can be executed only in duly equipped microanalytical laboratories by suitably trained users. Instead, MFA toolbox quantifying parameters subdivided starting from crossed-polarizers high-resolution RGB image, which useful identifying edges individual grains characterizing fabrics. Then, this integrated set micro-X-ray maps, elemental distribution maps. In addition, all achieved means low-cost easy-to-use equipment. We applied amphibolite, mylonitic-paragneiss, -tonalite samples to extrapolate particle different metamorphic types, well sandstone sample used another detector, comparing obtained results.